Quiescent Current Sensing

نویسندگان

  • Gianluca Cornetta
  • Jordi Cortadella
چکیده

Quiescent current monitoring was developed as a testing strategy complementary to the traditional voltage test. A current test has the advantage that a test pattern may be easily generated and nearly every single and multiple physical faults are current-testable, on the other hand it is slowlier than a logic test since we have to wait for the transient currents to settle before performing the measurement. With the new submicronic technologies the contribution of the leakage currents to quiescent consumption cannot be neglected anymore, as a consequence current sensing in not applyable to such technologies as a test approach. The major exploitation of quiescent current sensors is for screening purposes, that is for identifying not the faulty chips but the ones that consume more and thus are not suitable for low-power applications. The measurement of the quiescent currents is performed by an analog sensor that may be placed on or oo-chip. Built-in current sensors lead to a faster test but they also complicate and slow down the circuit to be tested. This problems may be avoided using an external sensor, anyway such sensors slow down the test. In this paper we study several possible implementations of built-in and external current sensors for monitoring the quiescent currents in integrated circuit.

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تاریخ انتشار 1997